Robust estimation based on one-shot device test data under log-normal lifetimes

11/03/2022

∙

by   N. Balakrishnan, et al.

∙

0

∙

share

In this paper we present robust estimators for one-shot device test data under lognormal lifetimes. Based on these estimators, confidence intervals and Wald-type tests are also developed. Their robustness feature is illustrated through a simulation study and two numerical examples.